PRODUCTION ENGINEERING MEASURE. DIFFUSED SEMICONDUCTOR DEVICES. DEVICE 14 PNP.

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Abstract:

The results of 2000 hours of operating life and 1000 hours of high temperature storage life on Device 14 Type 2N1084, Signal Corps Transistors are presented. The data has been summarized in graphical form to show the effects of these tests on various parameters. Engineering conclusions are given. Distribution data is presented graphically representing all parameters of the Device 14 specifications. Author

Author(s):
No Author(s) Identified
Author Organization(s):
TRANSITRON ELECTRONIC CORP WAKEFIELD MASS
Descriptive Note:
Special test rept. for 6 Jul 56-31 Mar 64.
Supplementary Note:
Legibility of this document is in part unsatisfactory. Reproduction has been made from best available copy.
Annotation:
Production engineering measure. Diffused semiconductor devices. Device 14 PNP.
Pagination:
0001

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
DA36 039SC72714
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*TRANSISTORS, RELIABILITY(ELECTRONICS), DIFFUSION, GERMANIUM, SILICON, STORAGE, HIGH TEMPERATURE, LIFE EXPECTANCY(SERVICE LIFE), PERFORMANCE(ENGINEERING)
Report Date:
1964 Mar 31