HIGH POWER SEMICONDUCTOR PHASE SHIFTING DEVICES, RELIABILITY TEST REPORT.

The use of high power semiconductor devices for phase shifting in array antennas is being considered. The large number of these components in an operational system makes reliability data important. Progress made within the last study interval is reported. This includes the continuation of the life tests through the two thousand hour readings. Data reduction shows that the leakage current has a decreasing failure rate with time early leakage failures should be screened out by a properly designed burn-in alternate forward and reverse bias is a more severe test than continuous reverse bias and capacitance variations decrease as frequency increases. Author