PRODUCTION ENGINEERING MEASURE TO INCREASE THE RELIABILITY OF THE TRANSISTOR TYPE 22N2034.

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Abstract:

The report describes the processing developments in wafer cleaning, mesa delineation, scribing of water, pellet to nickel-plated header soldering, nickel-plated clip to pellet soldering, final etch of soldered unit, final test and encapsulation of etched units, and weld and hermetic seal tests for the transistor type 2N2034. Author

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