STUDY OF THIN FILM COMPOUNDS FORMED FROM SIMUTANEOUSLY EVAPORATED CONSTITUENTS.

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Abstract:

Thin films of lead titanate have a number of advantages over barium titanate. Details of the preparation of lead titanate films by the simultaneous evaporation of lead and titanium oxides, initial attempts to increase the electrical resistance by the incorporation of small amounts of metal oxides, and preliminary experiments with insulator substrates are described. The capacitance, dissipation factor and leakage resistance of lead titanate films are comparable to those found for barium titanate. The frequency dependence of the capacitance and losses follows closely a relation given by Gevers for dielectrics of irregular structure. Strong x-ray diffraction patterns of tetragonal PbTiO3 have been obtained for films 1500 to 2500 A thick. Electron micrographs of the film surface show a uniform texture of grains of sizes between 1000 and 3000 A. Author

Author(s):
Hagenlocher, A. K. ; Reuersanger, A. E.
Author Organization(s):
GENERAL TELEPHONE AND ELECTRONICS LABS INC BAYSIDE NY BAYSIDE LAB
Descriptive Note:
Quarterly rept. no. 2, 1 Sep-30 Nov 63,
Pagination:
0025

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
TR63 206 2
Contract/Grant Number(s):
DA36 039AMC00105E
Project Number(s):
1G024401A112
 Subject Terms
Communities of Interest:
Advanced Electronics
Descriptor(s):
*OXIDES, *FILMS, *LEAD COMPOUNDS, EVAPORATION, TITANATES, TITANATES, CAPACITANCE, DIELECTRICS, TITANIUM COMPOUNDS, DIELECTRIC PROPERTIES, X RAY DIFFRACTION, VACUUM APPARATUS, VAPOR DEPOSITION, HIGH TEMPERATURE, PLATINUM ALLOYS, RHODIUM ALLOYS, AGING(MATERIALS), HEAT TREATMENT, VOLTAGE, ARGON, OXYGEN, ELECTRON MICROSCOPY, CAPACITORS
Keyword(s):
ELECTRON PROBES, ELECTRON MICROPROBE, LEAD(II) OXIDE, LEAD(II) TITANATE, THIN FILM ELECTRONICS, THIN FILMS, TITANIUM OXIDE
Report Date:
1964 Dec 30