DEVELOPMENT OF LOW NOISE- LOW DISTORTION TRANSISTOR

Work was directed toward development, evaluation and characterization of the XP-734, a PNPsilicon large area device. The XP-734 exhibits noise figure at the high current level necessary for low distortion operation, which is very little increased over its low current value. Both noise figure and distortion measurements indicate the need for a higher frequency device to improve overall performance. Tests on recently developed higher frequency devices indicate that improvement in both noise figure and distortion is possible with further device and process refinement. Author