Combined Environmental Testing of Semiconductor Devices.

reportActive / Technical Report | Accession Number: AD0291047 | Need Help?

Abstract:

The object of this study is to ascertain whether the combined environmental effects of temperature and pulsed nuclear gamma and neutron radiation on semiconductor devices are simply the sum of the two single effects or a complex interaction of the two, and, to develop a theoretical explanation of the observed phenomena

Author(s):
Long, Alton L.
Author Organization(s):
BURROUGHS CORP PHILADELPHIA PA
Descriptive Note:
Quarterly progress rept. no. 6,
Annotation:
STUDY TO ASCERTAIN WHETHER THE COMBINED ENVIRONMENTAL EFFECTS OF TEMPERATURE AND PULSED NUCLEAR RADIATION ON SEMICONDUCTOR EVICES ARE THE SUM OF TWO SINGLE EFFECTS OR AN INTERACTION OF THE TWO.
Pagination:
0055

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
DA36-039-SC-90766
Monitor Series:
DA
 Subject Terms
Joint Capability Areas:
JCA_3.2_Engagement; JCA_3_Force Application
Communities of Interest:
Advanced Electronics
Descriptor(s):
*SEMICONDUCTOR DEVICES, *ENVIRONMENTAL TESTS, *RADIATION DAMAGE, ARMY RESEARCH, TEMPERATURE, PULSES, NUCLEAR RADIATION, INTERACTIONS, GAMMA NEUTRON REACTIONS
Field(s)/Group(s):
Electrical and Electronic Equipment, Nuclear Weapons
Keyword(s):
Signal corps
Report Date:
1962 Jan 01