MICROANALYSIS WITH ULTRASOFT X-RADIATIONS

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Abstract:

The diffraction, reflection, absorption, fluorescence and the electronic emission which results from the interaction with ultrasoft x-rays are presented as practical bases for microanalysis. Recent developments on sources and detectors for the ultrasoft x-radiations are described. A preliminary report of a current investigation on low energy photo-Auger electron analysis and on a new type of low energy electron spectrometer is also presented. Author

Author(s):
Henke, Burton L.
Author Organization(s):
POMONA COLL CLAREMONT CALIF
Pagination:
0001

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFOSR-1995
Contract/Grant Number(s):
AF49 638 394
Monitor Series:
1995
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*MICROSTRUCTURE, *SECONDARY EMISSION, *X RAY SPECTROSCOPY, ABSORPTION, CELLS(BIOLOGY), CRYSTALS, DIFFRACTION, ELECTRON DIFFRACTION, FLUORESCENCE, METAL CRYSTALS, REFLECTION
Report Date:
1962 Jan 01