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Accession Number:
AD1089575
Title:
Nonlinear Characterizing of a New Titanium Nitride on Aluminum Oxide Metalens
Report Date:
2019-08-29
Abstract:
A sample metalens generated from Titanium Nitride deposited onto Aluminum Oxide was designed to focus at 10 microns with a beam centered at 800nm, and when analyzed with high intensity illumination was found to have a focal length of 9.65 + or - .003 microns at an intensity of 16.93 [MW/sq cm]. Analyzing this change by comparing it to a Fresnel Lens' physics shows that for this lens, the effective nonlinear index of refraction is certainly greater than the nonlinear index of just Titanium Nitride itself, at -1.6239 X 10 (exp -15) [m2 /W] compared to the materials -1.3 X 10 (exp -15) [m2 /W]. Analyzing this lens by taking it a step further and comparing it to a Fresnel Phase Zone Plate give a nonlinear index of 1:653 xx2; 10 (exp -11), which deviates from the materials nonlinear index even further, by over 4 orders of magnitude. This shows that the microscopic petterning of TiN in the correct geometric manner increases its effective nonlinear index by at least 4 orders of magnitude, but likely more.
Document Type:
Conference:
Journal:
Pages:
103
File Size:
2.76MB
Contracts:
Grants:
Distribution Statement:
Approved For Public Release
