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Accession Number:
AD1089572
Title:
The Challenges of Low-Energy Secondary Electron Emission Measurement
Report Date:
2019-11-25
Abstract:
The phenomena known as secondary electron emission was discovered over a century ago. Yet it remains very difficult to model accurately due to the limited availability of reliable experimental data. With the growing use of computer simulations in hardware development, the need for accurate models has increased. This research focused on determining what factors may be causing measurement discrepancies and methods for increasing the accuracy of measurements. It was found that several assumptions are commonly invoked when these measurements are performed that may not always be consistent with reality. The violation of these assumptions leads to measurement bias that is contingent upon the apparatus and the voltages used during the measurement. This research showed that secondary electron yield measurements are sensitive to changes in the apparatus geometry, the current level, and the electron gun settings. New techniques, hardware, and models were developed in order facilitate greater measurement repeatability and accuracy.
Document Type:
Conference:
Journal:
Pages:
265
File Size:
7.65MB
Contracts:
Grants:
Distribution Statement:
Approved For Public Release
