DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click
HERE to register or log in.
Accession Number:
ADP007930
Title:
Arsenic Passivation of Silicon by Photo-Assisted Metalorganic Vapour Phase Epitaxy,
Corporate Author:
ROYAL SIGNALS AND RADAR ESTABLISHMENT MALVERN (UNITED KINGDOM)
Report Date:
1992-05-22
Abstract:
The MOVPE deposition of semiconductors requires effective substrate surface preparation, especially where low temperature, photo-assisted growth is involved. Ideally this process should be achieved in situ in the growth reactor immediately prior to deposition. In a previous paper we reported the in situ removal of carbon from Si and GaAs substrate surfaces using 193nm radiation in a 1 Torr 02 ambient. This process generates a thin oxide which can then be removed by annealing at 850 deg C, although the process does not always go to completion. To protect the cleaned surface and to passivate the silicon substrate prior to deposition of GaAs we have explored the arsenic passivation techniques developed by Bringans. The oxidation resistance of surfaces prepared this way is also sufficient to permit transfer between laboratories for collaborative studies.
Supplementary Note:
This article is from 'Organization of the Optical Society of America Photonic Science Topical Meeting Series. Volume 3. The Microphysics of Surfaces: Beam-Induced Processes. Held in Santa Fe, New Mexico on 11-13 Feb 1991,' AD-A132 133,p132-133.
Pages:
0002
File Size:
0.00MB
