UNIVERSITAET DER BUNDESWEHR MUENCHEN NEUBIBERG (GERMANY F R)
The structure and growth of thin, epitaxially grown metal films vapor-deposited on metallic substrates have been studied by a variety of integrating techniques over many years. on the theoretical side detailed predictions exist on both the structure and growth of these films, which were derived from considerations of the lattice mismatch between the respective materials and from their thermodynamical properties. The verification of these predictions, however, requires an exact knowledge of the local structure and the topography of these films which was accessible only indirectly from these data. Scanning tunneling microscopy STM studies can provide direct information on these properties due to the local nature of the measurement which will be demonstrated in different examples.
This article is from 'Organization of the Optical Society of America Photonic Science Topical Meeting Series. Volume 3. The Microphysics of Surfaces: Beam-Induced Processes Held in Santa Fe, New Mexico on 11-13 Feb 1991.' AD-A254 135, p94-97.