Accession Number:

ADP007642

Title:

Improvement of the Minimum Detectability of Electro-Optic Sampling by using a Structurally New Probe,

Personal Author(s):

Corporate Author:

OPTICAL SOCIETY OF AMERICA WASHINGTON DC

Report Date:

1992-05-22

Abstract:

The noise in Electro-Optic E-0 sampling system is examined and is proved to be mainly due to wavelength dependence on the modulation. Then, we propose a structurally new E-0 probe for noise reduction. Use of a new E-0 probe having a spontaneous birefringence compensation crystal reduces the noise and resulted in a 6 f old improvement in minimum detectability. Finally, We have achieved a minimum detectable voltage of 7 mV Hz with 32 ps time resolution at d 0.

Supplementary Note:

This article is from the 'Osa Topical Meeting Proceedings (4th) on Picosecond Electronics and Optoelectronics Held in Salt Lake City, Utah on 13-15 March 1991. Volume 9,' AD-A253 472, p64-69.

Pages:

0006

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0.00MB

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