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Accession Number:
ADP007056
Title:
Model Study of Refractive Effects on X-Ray Laser Coherence,
Corporate Author:
LAWRENCE LIVERMORE NATIONAL LAB CA
Report Date:
1992-05-22
Abstract:
The role of smoothly varying transverse gain and refraction profiles on x-ray laser intensity and coherence is analyzed by modally expanding the electric field within the paraxial approximation. Comparison with a square transverse profile reveals that smooth-edged profiles lead to 1 a greatly reduced number of guided modes, 2 the continued cancellation of local intensity from a loosely guided mode by resonant free modes, 3 and the absence of extraneous or anomalous free mode resonances. These generic spectral properties should enable a considerable simplification in analyzing and optimizing the coherence properties of laboratory soft x-ray lasers.
Supplementary Note:
This article is from 'Osa Proceedings of the Topical Meeting (5th) on Short-Wave Length Coherent Radiation: Generation and Applications Held in Monterey, California on 8-10 April 1991. Volume 11,' AD-A252 973, p91-95.
Pages:
0005
File Size:
0.00MB
