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Characterization of Quartz Crystals by Cathodoluminescence,
HEBREW UNIV JERUSALEM (ISRAEL) RACAH INST OF PHYSICS
Cathodoluminescence CL in a scanning electron microscope SEM is used in the present work for investigating various growth sectors found in synthetic quartz crystals. This is a relatively simple, rapid and non-destructive method which gives a very high resolution. Our results using CL correlate well with those obtained by other methods, e.g. x-ray topography and light scattering tomography. The advantages of CL technique over other methods are described in detail and discussed.
This article is from the Proceedings of the Annual Symposium on Frequency Control (3th), 1-3 Jun 83, Marriott Hotel, Philadelphia, Pennsylvania, AD-A136 673, p185-186.