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Accession Number:
ADP002474
Title:
Characterization of Quartz Crystals by Cathodoluminescence,
Corporate Author:
HEBREW UNIV JERUSALEM (ISRAEL) RACAH INST OF PHYSICS
Report Date:
1983-01-01
Abstract:
Cathodoluminescence CL in a scanning electron microscope SEM is used in the present work for investigating various growth sectors found in synthetic quartz crystals. This is a relatively simple, rapid and non-destructive method which gives a very high resolution. Our results using CL correlate well with those obtained by other methods, e.g. x-ray topography and light scattering tomography. The advantages of CL technique over other methods are described in detail and discussed.
Supplementary Note:
This article is from the Proceedings of the Annual Symposium on Frequency Control (3th), 1-3 Jun 83, Marriott Hotel, Philadelphia, Pennsylvania, AD-A136 673, p185-186.
Pages:
0002
File Size:
0.00MB
