Accession Number:

ADP002232

Title:

Digital System Upset--The Effects of Simulated Lightning-Induced Transients on a General Purpose Microprocessor,

Personal Author(s):

Corporate Author:

NATIONAL AERONAUTICS AND SPACE ADMINISTRATION HAMPTON VA LANGLEY RESEARCH CENTER

Report Date:

1983-01-01

Abstract:

Flight-critical computer-based control systems designed for advanced aircraft must exhibit ultrareliable performance in lightning-charged environments. Digital system upset can occur as a result of lightning-induced electrical transients, and a methodology has been developed to test specific digital systems for upset susceptibility. Initial upset data indicates that there are several distinct upset modes and that the occurrence of upset is related to the relative synchronization of the transient input with the processing state of the digital system. A large upset test data base will aid in the formulation and verification of analytical upset reliability modeling techniques which are being developed. Author

Supplementary Note:

This article is from 'International Aerospace and Ground Conference on Lightning and Static Electricity (8th): 'Lightning Technology Roundup,' held at Fort Worth, Texas on 21-23 June 1983,' AD-A135 100, p87-1 thru 87-12.

Pages:

0012

Descriptors:

Identifiers:

Communities Of Interest:

File Size:

0.00MB

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