Accession Number:

ADP002211

Title:

Nanosecond Resolution of E,H and I in Aircraft Lightning Test Rigs,

Personal Author(s):

• Burrows,B. J. C.

Corporate Author:

UKAEA CULHAM LAB ABINGDON (ENGLAND)

Report Date:

1983-01-01

Abstract:

Many designs of test rig have emerged in recent years incorporating hardwired connections Culham, LTA, etc. and design incorporating series open arcs at each end of aircraft McDonnell, etc.. Important characteristics of the test rigs are not specified, but these characteristics control the generation of large and usually hf transients through the fast coupling processes D,B. Both lumped element and distributed element representation of these test rigs and the capacitor banks driving them will be given, and the effects of parameter and geometry variations will be highlighted. It will be shown that quantitative analysis of fast transients D,B requires much closer specification of the test rig performance including switch closure time, capacitor bank and connecting line inductance, and the transmission line impedance of the test rig. The recent tests on the Fly-by-Wire Jaguar at Warton near Preston in England showed the need for developing a quantitative relationship between hf transients and the fast coupling processes. Author

Supplementary Note:

This article is from 'International Aerospace and Ground Conference on Lightning and Static Electricity (8th): 'Lightning Technology Roundup,' held at Fort Worth, Texas on 21-23 June 1983,' AD-A135 100, p63-1 thru 63-9.

Pages:

0009

Descriptors:

• *LIGHTNING
• *AIRCRAFT
• VOLTAGE
• SIMULATION
• TEST METHODS
• CIRCUIT ANALYSIS
• ELECTRIC FIELDS
• WAVEFORMS
• SYMPOSIA
• UNITED KINGDOM

Identifiers:

• Component reports

Subject Categories:

Communities Of Interest:

• Air Platforms

File Size:

0.00MB