NATIONAL BUREAU OF STANDARDS GAITHERSBURG MD CERAMICS DIV
Environmentally enhanced crack growth data was obtained for GaAs in a number of chemical environments. The effectiveness of particular environments was predicted on the basis of existing crack growth models. No environment was found to produce crack growth in silicon. Dielectric aging studies were conducted on capacitor ceramics. A correlation was shown between decreases in dielectric constant and reductions in indentation strength at small indentation loads. Keywords Crack growth, Fracture, Stress corrosion, Ceramics, Silicon, Gallium arsenide, Capacitors, Dielectric aging.