ROYAL SIGNALS AND RADAR ESTABLISHMENT MALVERN (ENGLAND)
The determination of the thermally generated, diffusion limited leakage current density of lateral collection diode arrays is not possible analytically except for those with the simplest of geometries. It is shown here how the simulation of a spot-scan experiment, using a Monte Carlo analysis, can be used to determine the leakage current density of an array of any geometry. In particular, it is used to analyse a diode array of hexagonal symmetry as a function of array geometry and bulk diffusion length. The analysis shows that the leakage current of a diode may be substantially reduced by the presence of nearby reverse-biased diodes.