This study has addressed the use of built-in-test BIT for fault detection, isolation, and repair in the Military Computer Family MCF. Particular emphasis was given to the identification and assessment of BIT techniques applicable to the MCF-ANUYK-41V. The MCF-ANUYK-41V is software compatible with Digital Equipment Corporations PDP-1170. The approach taken in this study was to assume a fault population, predict where in the system these faults are most likely to occur and develop a rationale for deploying built-in fault detection and localization resources accordingly. The fault population assumed included both stuck-at and transient faults. It was determined using a failure prediction program based on MIL-HDBK-217B that for related computers, it is likely that 60 of all faults will occur in memory, 30 will be in the CPU and the remainder will happen throughout the rest of the computer including the power supply.
Final rept. 14 Feb-16 Oct 78,
Prepared in cooperation with Research Triangle Inst., Research Triangle Park, NC. Rept. no. RTI/1600/00-05F. DOI: 10.21236/ADA067744