In an effort to increase the capability of infrared sensor testing at AEDC due to the requirements of advanced technology sensors, various novel, state-of-the-art infrared sourcces were considered as immediate supplements to or eventual replacements for existing sources. Recent and future source requirements such as sufficiently narrow linewidth, wavelength calibration accuracy, and large dynamic range of intensity cannot be met by blackbody-type sources and their attendant optics. A multiplicity of modern infrared radiation generation techniques exists, and two of these, the tunable diode lasers and difference-frequency generation, were identified as potential short-term and long-term solutions to at least some of the new requirements. In addition, a diode laser was rented for a one-month period for an experimental evaluation of particular characteristis of importance in its proposed sensor testing application.
Final rept. Jul 19-Sep 1977
Prepared in cooperation with ARO, Inc., Tullahoma, TN. DOI: 10.21236/ADA067316