DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click
HERE to register or log in.
Accession Number:
AD1041934
Title:
Generation of Controlled Analog Emissions from Embedded Devices using Software Stress Methods
Corporate Author:
SPACE AND NAVAL WARFARE SYSTEMS CENTER PACIFIC SAN DIEGO CA SAN DIEGO United States
Report Date:
2017-03-01
Abstract:
In this paper, we present a new method that uses software diagnostic tools to study the generation of induced spurious physical emissions from embedded devices over air-gapped remote channels. With this methodology, spurious emissions are induced during controlled computer operations such as dynamic memory allocation, hard disk writing and computations. Each stressing operation creates a pulse in an amplitude shift keying scheme. These software techniques can provide repeatable measurements of embedded devices for mapping unwanted emissions over air-gapped channels.
Descriptive Note:
Conference Paper
Supplementary Note:
Government Microcircuit Applications and Critical Technology Conference (42nd), GOMACTech 17, 20 Mar 2017, 23 Mar 2017, See also AD1034309 - 42nd Annual Gomactech Conference (GOMACTech 17) Government Microcircuit Applications And Critical Technology Conference. Technologies For Secure Spectrum Access From Dc To Light. Held At The Grand Sierra Resort, Reno, Nevada, March 20-23, 2017
Pages:
0005
Distribution Statement:
Approved For Public Release;
File Size:
0.72MB
