Accession Number:

AD0904625

Title:

Electroreflectance. Part 8. Symmetry Analyses.

Corporate Author:

NAVAL WEAPONS CENTER CHINA LAKE CA

Report Date:

1972-10-01

Abstract:

In semiconductors, a correlation between the observed electroreflectance and the characteristic parameters of the energy-band structure has been established. More recently, by using the inherent symmetry breaking properties of the modulating electric field, even more detailed information has been obtained about the k-space origin of optical transitions. These symmetry analysis studies, both theoretical and experimental, were initiated and completed at NWC. The results of these studies are presented in three reprints of papers previously published in the open literature under the following titles 1 Symmetry Analysis of Electroreflectance Spectra 2 Detailed Study of the Gamma sub 15 Conduction-Band Minimum in Germanium by Photoemission and Transverse Electroreflectance and 3 Symmetry of the 4.5-eV Optical Interband Threshold in GaAs.

Descriptive Note:

Technical publication,

Supplementary Note:

See also Part 7, AD-904 112L.

Pages:

0033

Communities Of Interest:

File Size:

0.00MB

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