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Accession Number:
AD0838462
Title:
AUTOMATIC AND MANUAL INTEGRATED CIRCUIT TEST EQUIPMENT
Corporate Author:
NEW YORK UNIV NY ENGINEERING RESEARCH DIV
Report Date:
1968-08-01
Abstract:
The report presents a brief discussion on the various instruments in use today for electrical testing of integrated circuits. A tabulation of commercially available manual and automatic testers is included.
Pages:
0050
Distribution Statement:
Approved for public release; distribution is unlimited.
Contract Number:
N00039-68-C-3579
File Size:
2.19MB
