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Accession Number:
AD0835860
Title:
RELIABILITY STUDIES FOR ADVANCED INTEGRATED CIRCUITS ENGINEERING CHANGE 'A'.
Corporate Author:
MOTOROLA INC PHOENIX AZ SEMICONDUCTOR GROUP
Report Date:
1968-06-01
Abstract:
The purpose of this phase of the study was to establish procedures, applicable to dielectric isolated integrated circuits, which will screen out potentially unreliable devices from a production lot. In this program the results of a 2000-hour, 175-milliwatt dissipation, 125C ambient operating life test were used to determine the effectiveness of various sequences of environmental tests and examinations as screens. The tests and examinations investigated were visual examinations, high temperature storage, temperature cycling, centrifuge data at ambient temperature recorded at 25C, -55C and 125C at various intervals. The results of tests confirmed the findings of the previous phase of this program. No failure modes which could be attributed to the dielectric isolation process EPIC were detected in significant portions. The most effective screen was found to be burn-in at 125C. Other screens which did produce failures were temperature cycle, dye penetrant seal integrity tests and high temperature storage. A detailed screening procedure is found in Section 4.0. There is also some evidence to suggest that special precap visual inspection criteria are desirable for EPIC circuitry. These are also presented in Section 4.0. Author
Descriptive Note:
Final rept 3 Jan 67-3 Jan 68,
Pages:
0085
Contract Number:
AF 30(602)-4021
File Size:
0.00MB
