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MEASUREMENT TECHNIQUES FOR COMPLEX PERMEABILITY AND PERMITTIVITY OF HIGHLY CONDUCTIVE MATERIALS AT MICROWAVE FREQUENCIES.
EMERSON AND CUMING CANTON MA
New techniques are presented for the measurement of complex permeability and permittivity of highly conductive materials at microwave frequencies. The techniques are also applicable to low-loss and non-magnetic materials. Experiences are reported with ten methods 1 free-space reflectometer, 2 free-space Michelson interferometer, 3 Fabry-Perot variation of free-space Michelson interferometer, 4 Masons double-incidence technique for short- and open-circuit in waveguide, 5 Masons double-incidence technique for single interface in waveguide, 6 Masons double-incidence technique combined with transmission measurement in waveguide, 7 half thickness reflection with full thickness transmission in waveguide, 8 half and full thickness transmission in waveguide and free space, 9 short circuit-open circuit waveguide dielectrometer an accepted older waveguide method used for comparison, 10 transmission in free space an older free-space method for comparison. All measurements were made at X-band on a standard set of twelve specimens covering a wide range of dielectric properties. It is concluded that the free-space Michelson interferometer and the half and full thickness transmission-coefficient measurement in either waveguide or free space offer the best improvements over the older short circuit-open circuit transmission line technique. Data reduction procedures are presented for these best methods. Author
Final rept. 1 Jul 65-1 Aug 66,