ABOUT MEASUREMENTS OF SMALL SERVICE LIVES BY FREQUENCY-PHASE CHARACTERISTIC OF IMPEDANCE OF P-N TRANSITION (OB IZMERENII MALYKH VREMEN ZHIZNI PO CHASTOTNO-FAZOVOI KHARAKTERISTIKE IMPEDANSA P-N PEREKHODA),
A theoretical basis and experimental proof is given for the possibility of using the phase shift between the voltage across a diode and the current through it to measure short lifetimes in semiconductors. In contrast to previously developed methods, this method does not require establishment of limiting operating conditions for the diode conditions for the current or voltage generator. The method facilitates the measurement of lifetimes less than 10-9 sec. An experimental check of the method is made on an electrical analog of a diode. Author
Unedited rough draft trans. of Akademiya Nauk Uzbekskoi SSR, Tashkent. Doklady, n10 p11-4 1964, by L. Marokus.