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Accession Number:
AD0623197
Title:
EVALUATION OF SILICON METALLIC RECTIFIERS.
Corporate Author:
ARMOUR RESEARCH FOUNDATION CHICAGO ILL
Report Date:
1961-07-01
Abstract:
Three groups of type 1N540 rectifiers are being subjected to life test at different ambient temperatures to determine three points on a curve of life versus ambient temperature. An accumulated test time of 10,000 hours has been represented by data gathered on the 200C environmental group. The life experiment on this group was terminated after the 10,000-hour measurement. A total of 35 failures have occurred, and 10 diodes have survived the test on this group. The 185C and 170C environmental groups have been subjected to over 7000 hours of experiment. At the end of 6912 hours, 32 failures had occurred for the 185C test group and seven failures for the 170C test group. Diodes from Manufacturer 6 have continued to exhibit superior performance at the elevated temperatures of 200C and 185C. Author
Descriptive Note:
Interim engineering rept. no. 12, 1 Apr-30 Jun 61,
Supplementary Note:
See also AD-276 987.
Pages:
0023
Contract Number:
NObs72444
File Size:
0.00MB
