Accession Number:

AD0610774

Title:

RELIABILITY ANALYSIS OF NON-ELECTRONIC COMPONENTS USING WEIBULL, GAMMA, AND LOG NORMAL DISTRIBUTIONS.

Personal Author(s):

Corporate Author:

AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING

Report Date:

1964-08-01

Abstract:

Reliability analysis using the Weibull, log normal, and gamma distributions for non-electronic components is complicated by non-standardization, small lot sizes, and the interaction between components. The Weibull distribution is useful in the failure analysis of structures, ball bearings, brittle beams, and spin gyros. The log normal distribution is used in the failure analysis of aircraft structures and helicopter blades, while the gamma distribution is useful in failure analysis of aluminum strips. It can also be shown that data for a particular example may be fitted to one or more of the distributions with equal success. Author

Descriptive Note:

Master's thesis,

Pages:

0083

File Size:

0.00MB

Full text not available:

Request assistance