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Accession Number:
AD0610739
Title:
DESIGN AND DEVELOPMENT OF SEMICONDUCTOR TEST SET, AN/USM-171.
Corporate Author:
AMERICAN ELECTRONIC LABS INC COLMAR PA
Report Date:
1964-09-30
Abstract:
This quarter represented an intensive development and test phase which concentrated on the emitter finder stop-test circuit and fault circuits for the Semiconductor Test Set ANUSM-171. Verification of in-circuit leakage measurement and lead finding capabilities were achieved. Mechanical packaging of the basic structure was accomplished. Author
Descriptive Note:
Quarterly rept. no. 5, 1 Jul-30 Sep 64,
Supplementary Note:
See also AD-601 994.
Pages:
0031
Contract Number:
DA36 039AMCO3242E
File Size:
0.00MB
