DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click HERE
to register or log in.
DESIGN AND DEVELOPMENT OF SEMICONDUCTOR TEST SET, AN/USM-171.
AMERICAN ELECTRONIC LABS INC COLMAR PA
This quarter represented an intensive development and test phase which concentrated on the emitter finder stop-test circuit and fault circuits for the Semiconductor Test Set ANUSM-171. Verification of in-circuit leakage measurement and lead finding capabilities were achieved. Mechanical packaging of the basic structure was accomplished. Author
Quarterly rept. no. 5, 1 Jul-30 Sep 64,
See also AD-601 994.