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Accession Number:
AD0460756
Title:
THIN-FILM POLYCRYSTALLINE FIELD-EFFECT TRIODE.
Corporate Author:
RCA LABS PRINCETON NJ
Report Date:
1965-03-01
Abstract:
The effect of substrate temperature and deposition rate on the surface topology and crystallite size of CdS films has been studied by electron microscopy. Hall mobility and resistivity of CdS films have been determined as a function of temperature for various evaporation, processing, and over-coating procedures. Capacitance-voltage data on metal-insulator-CdS capacitors are being taken in conjunction with bias-temperature treatments in order to investigate sources of insulator instability. High-temperature materials are being tested for TFT insulators. New materials and techniques for encapsulation of TFTs by means of an evaporated overcoat have been investigated. Reproducibility studies are being carried out with particular attention to substrate condition, cadmium sulfide film preparation, and masking jig design. Facilities and procedures for testing TFTs have been improved. Experimental TFTs using InSb and CdSe are being investigated. Author
Descriptive Note:
Quarterly rept. no. 2, 1 Oct-31 Dec 64,
Pages:
0067
Contract Number:
DA28 043AMC00231E
File Size:
0.00MB
