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PULSED NUCLEAR RADIATION EFFECTS ON ELECTRONIC PARTS AND MATERIALS
ARMY ELECTRONICS LABS FORT MONMOUTH NJ
The results of a recent series of experiments conducted on electronic parts at the Sandia Pulsed Reactor Facility SPRF are discussed. Cables, resistors, and ferrite cores were in included in the program. Four cables including RG-62AU, RG-59BU, RG-81U, and a twisted pair line cord were exposed in various geometries, circuits, and applied voltages. Exposed also were 100- ohm, 1-kohm, 10-kohm and 100-kohm carbon film resistors, a 100-ohm wire wound resistor, as well as manganese-zinc and nickel-zinc ferrite cores. Peak induced currents observed in cables were 3000 to -2650 microamp in looped RG-81U, 600 to -2500 microamp in looped RG-62AU, 300 to -380 microamp in looped RG-59BU, 400 to -1650 microamp in looped twisted pair, 80 to -90 microamp in straight potted RG-26AU, and 800 to -500 microamp in straight unpotted RG-62AU cable. Low-value resistors appeared quite stable, but resistors greater in value than 10 kohm showed a spurious and inconsistent behavior, attributed largely to lead cable efforts. The measurements on cables and resistors seem to bear out the fact that reliable data cannot yet be obtained for many exposed component parts because of the unpredictable behavior of the cables used for signal transmission.