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Accession Number:
AD0294110
Title:
PRODUCTION ENGINEERING MEASURE RELIABILITY THRU PROCESS IMPROVEMENT
Corporate Author:
TRW SEMICONDUCTORS INC LAWNDALE CALIF
Report Date:
1962-09-30
Abstract:
Effort is presented on the Production engineering measure to increase transistor reliability. Process improvements within the major tasks of material evaluation, diffusion and photoresist, contact metallizing, lead attachment, and encapsulation were accomplished. Emphasis was placed on the method of contact metallizing and lead attachment. Sample quantities of devices utilizing an evaporated aluminum layer for base and emitter contacts were placed on life test. Equipment was received to begin aluminum wire bonding. Feasibility tests to determine stress levels of the step-stress aging were started. Reliability evaluation of production devices continued to further substantiate the failure rate basis from which the effects of the process improvement tasks will be measured. Author
Pages:
0001
File Size:
0.00MB
