DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click HERE
to register or log in.
DESIGN CRITERIA FOR RELIABLE TRANSISTORIZED ASSEMBLIES
VITRO LABS WEST ORANGE N J
Effort continued on a study of the effects of variations in transistor and other component parameters on the circuit performance of General Usage Assemblies. The information derived from this program is necessary to determine the design criteria for reliable transistor assemblies. Data are presented on the control of primary design factors effecting circuit reliability, compensating circuits used to minimize the effects of transistor variations, methods for accelerating transistorized assembly life tests, and modifications of existing failure predictions rates to provide the circuit designer with guidelines for designing reliable tran istorized assemblies. Author