Accession Number:

ADP013353

Title:

Comparison of Microwave Dielectric Properties of between (001) and (011) Ferroelectric Ba(1-x)Sr(x)TiO3 Thin Films Grown by Pulsed Laser Deposition

Descriptive Note:

Conference proceedings

Corporate Author:

ELECTRONICS AND TELECOMMUNICATIONS RES INST TAEJON (REPUBLIC OF KOREA) WIRELESS COMM DEPT/BASIC RESEARCH LAB

Report Date:

2003-04-03

Pagination or Media Count:

6.0

Abstract:

The effects of anisotropic dielectric properties of ferroelectric Ba1-xSrxTiO3 BST films on the characteristics of phase shifter have been studied in microwave regions at room temperature. Ferroelectric BST films with 001 and 011 orientation were epitaxially grown on 001 and 011 MgO substrates, respectively, by pulsed laser deposition method. The structures of BST films were investigated using x-ray diffraction measurement. The microwave properties of orientation engineered BST films were investigated using coplanar waveguide transmission lines that were fabricated on BST films using a thick metal layer by photolithography and etching process. The measured differential phase shift and insertion loss S sub 21 for 011 BST films are larger than those for 001 BST films. Dielectric constants of the ferroelectric BST films are calculated from the measured S sub 21 using a modified conformal-mapping model.

Subject Categories:

  • Physical Chemistry
  • Lasers and Masers
  • Electricity and Magnetism
  • Radiofrequency Wave Propagation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE