Theory of Electrostatic Probe Microscopy: A Simple Perturbative Approach
UNIVERSIDAD AUTONOMA DE MADRID (SPAIN)DEPARTMENTO DE FISICA DE LA MATERIA CONDENSADA
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A theoretical approach to electrostatic scanning probe microscopy is presented. We show that a simple perturbation formula, originally derived in the context of scattering theory of electronmagnetic waves can be used to obtain the capacitance and the electrostatic force between a metallic tip and an inhomogeneous dielectric sample. For inhomogeneous thin dielectric films the scanning probe signal is shown to be proportional to the convolution between an effective surface profile and a response function of the microscope. This provides a rigorous framework to address the resolution issue and the inverse problem.
- Atomic and Molecular Physics and Spectroscopy
- Solid State Physics