Accession Number:

ADP013207

Title:

Theory of Electrostatic Probe Microscopy: A Simple Perturbative Approach

Descriptive Note:

Conference proceedings

Corporate Author:

UNIVERSIDAD AUTONOMA DE MADRID (SPAIN)DEPARTMENTO DE FISICA DE LA MATERIA CONDENSADA

Report Date:

2001-06-01

Pagination or Media Count:

4.0

Abstract:

A theoretical approach to electrostatic scanning probe microscopy is presented. We show that a simple perturbation formula, originally derived in the context of scattering theory of electronmagnetic waves can be used to obtain the capacitance and the electrostatic force between a metallic tip and an inhomogeneous dielectric sample. For inhomogeneous thin dielectric films the scanning probe signal is shown to be proportional to the convolution between an effective surface profile and a response function of the microscope. This provides a rigorous framework to address the resolution issue and the inverse problem.

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE