Accession Number:

ADP013148

Title:

X-ray Diffraction Study of CdSe/BeTe Nanostructures Grown by MBE with Stressor-Controlled Interfaces

Descriptive Note:

Conference proceedings

Corporate Author:

RUSSIAN ACADEMY OF SCIENCES SAINT PETERSBURG IOFFE PHYSICAL-TECHNICAL INST

Personal Author(s):

• Kyutt, R. N.
• Shubina, T. V.
• Sorokin, S. V.
• Ivanov, S. V.
• Kop'ev, P. S.

Report Date:

2001-06-01

Pagination or Media Count:

3.0

Abstract:

This report documents a detailed XRD study of the novel type-II CdSeBeTe nanostructures formed by stressor-assisted self-formation. High sensitivity of the diffraction curves to interface types is revealed. The model developed for a sinmilation of rocking curves includes spontaneous formation of BeSe enriched interface formation when the smaller amount of CdTe FM stressor as compared to that corresponding to a maximum RHEED SSI is intentionally deposited.

Descriptors:

• *X RAY DIFFRACTION
• *MOLECULAR BEAM EPITAXY
• *NANOSTRUCTURES
• INTERFACES
• SUPERLATTICES
• RUSSIA
• ELECTRON DIFFRACTION
• ENRICHMENT
• CADMIUM SELENIDES
• HIGH SENSITIVITY

Subject Categories:

• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE