Accession Number:

ADP013091

Title:

Resonant Second-Harmonic Phase Spectroscopy of the Buried Interfaces of Column IV Semiconductors

Descriptive Note:

Conference proceedings

Corporate Author:

MOSCOW STATE UNIV (RUSSIA) DEPT OF PHYSICS

Report Date:

2000-06-23

Pagination or Media Count:

4.0

Abstract:

The second-harmonic interferometric spectroscopy SHIS is proposed as a new spectroscopic technique to study the resonant electron response of solid state nanostructures. The combination of the second-harmonic SH amplitude and phase spectra is shown to be more sensitive to resonant parameters of the electron density of states in comparison with the conventional SH intensity measurements. The resonant anisotropic SH response of buried oxidized Si111 and Ge111 surfaces is studied using SHIS in the vicinity of the E2 critical points. Both spectra of the phase and amplitude of the SH field with different lineshapes for Si and Ge surfaces are obtained.

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE