Accession Number:

ADP012914

Title:

Atomic Force Microscopy Characterization of Nanostructured Materials Using Selective Chemical Etching

Descriptive Note:

Conference proceedings

Corporate Author:

RUSSIAN ACADEMY OF SCIENCES KAZAN PHYSICAL TECHNICAL INST

Report Date:

1999-06-18

Pagination or Media Count:

4.0

Abstract:

Atomic force microscopy and selective chemical etching were used to estimate the shape and sizes of the buried alpha-Fe nanoparticles created by ion bombardment in silica glasses. In situ and ex situ AFM measurements were performed. New data about distribution of nanoparticles and radian on induced defects both in a plane and on depth were obtained by these methods.

Subject Categories:

  • Physical Chemistry
  • Coatings, Colorants and Finishes

Distribution Statement:

APPROVED FOR PUBLIC RELEASE