Atomic Force Microscopy Characterization of Nanostructured Materials Using Selective Chemical Etching
RUSSIAN ACADEMY OF SCIENCES KAZAN PHYSICAL TECHNICAL INST
Pagination or Media Count:
Atomic force microscopy and selective chemical etching were used to estimate the shape and sizes of the buried alpha-Fe nanoparticles created by ion bombardment in silica glasses. In situ and ex situ AFM measurements were performed. New data about distribution of nanoparticles and radian on induced defects both in a plane and on depth were obtained by these methods.
- Physical Chemistry
- Coatings, Colorants and Finishes