Accession Number:

ADP011646

Title:

Anisotropic Electromagnetic Properties of RF Sputtered Ni-Al(2)O(3) Composite Thin Films

Descriptive Note:

Corporate Author:

BOTSWANA UNIV GABORONE DEPT OF PHYSICS

Personal Author(s):

Report Date:

2000-09-29

Pagination or Media Count:

4.0

Abstract:

Experimental data of the permittivity of RF sputtered Ni-Al2O3 thin films were studied in the wavelength region from 300 to 2500 nanometers 1. The data were analyzed in the framework of the Bergman-Milton theory and it was shown that they lie inside the Hashin- Shtrikman bounds, but outside the Bergman-Milton bounds. The latter indicates a strong electromagnetic anisotropy of the composite thin film. For a more detailed theoretical study, we performed calculations using the Maxwell Garnett, Bruggeman and Incremental Maxwell Garnett homogenization formalisms for uniaxial dielectric composites 2-4. A comparison between the calculated and measured permittivities was made on the basis of a least-square fit. In this paper, we interpret the results and suggest models for the microstructures of the Ni-Al2O3 thin films.

Subject Categories:

  • Laminates and Composite Materials
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE