Accession Number:

ADP011549

Title:

Research of a Microplasma Breakdown in Thin Films of Glassy Semiconductors

Descriptive Note:

Corporate Author:

MOSCOW INST OF POWER ENGINEERING (RUSSIA)

Personal Author(s):

Report Date:

2001-06-01

Pagination or Media Count:

4.0

Abstract:

Experiments were carried out to detect presence of a microplasma in thin films of glassy chalcogenide semiconductors. Films of As2Se3 and As2SeTe2 were investigated. In the regime of a soft breakdown time series of current and voltage of the samples based on As2Se3 were measured and then processed by spectral analysis. Films of As2SeTe2 were used for experiment with long discharge space. This experiment resulted in observation of oscillating streamer discharge. A model was suggested to explain the phenomenon.

Subject Categories:

  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE