Accession Number:

ADP011515

Title:

UV Irradiation Effects in Pure and Tin-Doped Amorphous AsSe Films

Descriptive Note:

Corporate Author:

NATIONAL INST OF MATERIALS PHYSICS BUCHAREST (ROMANIA)

Report Date:

2001-06-01

Pagination or Media Count:

4.0

Abstract:

Pure and tin-doped AsSe amorphous films were investigated. The changes in the MRO induced by Sn were analyzed be accurate profiling the first sharp diffraction peak FSDP in the X-ray diffraction diagram. A shift of FSDP as a function of tin concentration was observed. The structural changes induced by ultraviolet rays lambda 336 nm for various time intervals of irradiation were revealed by small angle X-ray diffraction. It was revealed the formation of a special layer at the surface of the films, whose thickness increases during UV irradiation.

Subject Categories:

  • Electrooptical and Optoelectronic Devices
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE