Exit Wave Reconstructions of Surfaces and Interfaces Using Through Focus Series of HREM Images
DELFT UNIV OF TECHNOLOGY (NETHERLANDS)LAB OF MATERIALS SCIENCE
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The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy HREM images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The main advantage of this technique compared to conventional HREM is better interpretable images due to the deblurring of the information. This is in particular valid for surfaces and interfaces, as is shown by examples of exit waves of a 001 surface of NiO, a single slab of Mo,CoS2 on gamma-Al2O3 and the sapphireCeO2 interface.
- Atomic and Molecular Physics and Spectroscopy