DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click
HERE to register or log in.
Accession Number:
ADP007970
Title:
Selective Growth of InP/GaInAs Heterostructures Using Metalorganic Molecular Beam Epitaxy,
Descriptive Note:
Corporate Author:
AT AND T BELL LABS MURRAY HILL NJ
Report Date:
1992-07-01
Pagination or Media Count:
4.0
Abstract:
Selective area growth is used in the fabrication of Si epitaxial devices such as bipolar transistors. This growth technique facilitates the preparation of very complex self-aligned and buried transistor structures. Selective growth has been investigated in the III-V materials, without, however, any significant results pertaining to the optical or electrical quality of the material grown, or device results. In this work, we investigate selective growth of InP and GaInAs on S02-masked InP substrates using metalorganic molecular beam epitaxy MOMBE. Group Ill and V elements are derived from triethylgallium and trimethylindium, and AsH3 and PH3 respectively. Excellent selectivity is achieved in the temperature range from 5 10 to 540 deg C.
Distribution Statement:
APPROVED FOR PUBLIC RELEASE