Characterization of a New Photorefractive Material:K sub 1-y, L sub y, T sub 1-x, N sub x,
NANKAI UNIV TIANJIN (CHINA) DEPT OF PHYSICS
Pagination or Media Count:
We have demonstrated the growth of a new photorefractive material, KLTN, and have characterized its photorefractive properties. The crystal was of good quality with a phase transition at 178 dot K. It displayed a strong quadratic photorefractive effect with a sensitivity of 0.0000724. The maximum diffraction efficiency observed was 75 with a corresponding coupling constant of Gamma 1.75cm. The writing times were given by tau sub write 6 sec-sq.cmW, and there was a strong readwrite time asymmetry. The photorefractive process was shown to be voltage controllable. Based on this work, KLTNs seem to be highly promising materials for volume hologram storage applications.
- Acoustooptic and Optoacoustic Devices