Accession Number:

ADP006642

Title:

Ferroelectric PbZr0.2Ti0.803 Thin Films on Epitaxial Y-Ba-Cu-O,

Descriptive Note:

Corporate Author:

RADIANT TECHNOLOGIES ALBUQUERQUE NM

Report Date:

1991-04-05

Pagination or Media Count:

8.0

Abstract:

Using a combination of pulsed laser deposition and sol-gel processing, we have fabricated epitaxial PbZr0.2Ti0.8O3YBa2Cu3O7-x heterostructures on single crystalline 001 LaAlO3. Rutherford back-scattering studies show the composition to be the same as the nominal starting composition. Transmission electron microscopy shows the existence of a randomly oriented polycrystalline microstructure in the PZT layer with a grain size of about 500-1000A. Microscopic pores were also observed in the PZT layer. The PZT film exhibits ferroelectric hysteresis with a saturation polarization of 22-25 micron Ccm2 at 7.5V, lkHz, a remanence of 5-6 micro Ccm2 and a coercive field of about 40kVcm.

Subject Categories:

  • Electricity and Magnetism
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE