Accession Number:

ADP006641

Title:

Fast Decay Component of the Remanent Polarization in Thin-Film PZT Capacitors,

Descriptive Note:

Corporate Author:

HARRY DIAMOND LABS ADELPHI MD

Report Date:

1991-04-05

Pagination or Media Count:

10.0

Abstract:

The remanent polarization 2P sub r of thin-film PZT capacitors was examined using a voltage pulse method. The amount of polarization remaining after a write pulse was found to be a function of both the time between the write and read pulses and the duration of the write pulse. The 2P sub r was found to decrease significantly from 3 us to 100 ms after the initial write. In some cases the remanent polarization decayed by almost 70 percent in this time regime. The fast decay component of 2P sub r was also observed to be dependent on-the duration of the write pulse the write pulse width. The longer the write pulse was applied the smaller the fast decay component became, leaving more measurable charge retained after 100 ms.

Subject Categories:

  • Electricity and Magnetism
  • Ceramics, Refractories and Glass

Distribution Statement:

APPROVED FOR PUBLIC RELEASE