Accession Number:

ADP003514

Title:

A Dual-Ported, Dual-Polarized Spherical Near-Field Probe,

Descriptive Note:

Corporate Author:

SCIENTIFIC-ATLANTA INC GA

Personal Author(s):

Report Date:

1984-03-01

Pagination or Media Count:

15.0

Abstract:

The spherical near-field measurement technique is a convenient and economical method for testing antennas. It is particularly useful for electrically small antennas at low frequencies. It requires much less real estate than conventional far-field ranges and yields more accurate results in a more controlled and secure environment. The spherical near-field measurement technique can be used to test antennas too large in physical size for the compact range technique and, unlike other near-field measurement techniques, it permits the use of standard spherical coordinate positioners. The most serious disadvantage of spherical near-field testing is the time required to perform a test.

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE