Apparatus and Method for Measuring Intermolecular Interactions by Atomic Force Microscopy
Patent, Filed 8 May 1998, patented 30 Nov 1999
DEPARTMENT OF THE NAVY WASHINGTON DC
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A sample support member for atomic force microscopy of intermolecular interactions includes a sample support base having a plurality of protrusions, each protrusion having an apical substrate region or tip that has been chemically modified by the immobilization thereon of a sample compound or of a linking compound that is capable of binding a sample compound. A reference compound support member has a surface region having at least one reference compound immobilized thereon. The relative position and orientation of the reference compound support member and the substrate support member are controlled to select a particular protrusion and to cause an interaction between a reference compound immobilized on the surface region of the free end of the cantilever and the sample compound immobilized on the apical substrate are of the selected protrusion. A physical parameter associated with the interaction between the reference compound and the sample compound can be measured.
- Physical Chemistry
- Test Facilities, Equipment and Methods