Method and Design for the Suppression of Single Event Upset Failures in Digital Circuits Made From GaAs and Related Compounds
Patent application, filed 9 Dec 1999
OFFICE OF NAVAL RESEARCH ARLINGTON VA
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Like all electronic devices, digital circuits execute the functions for which they are designed, through the careful control of charge flow within the circuit. The introduction of stray charge through leakage, temperature excursions or ionizing radiation can cause any electronic circuit to malfunction. Digital circuits, because of the low voltages and currents inherent in the devices from which they are constructed, are extremely susceptible to stray charge. The present invention relates generally to digital circuits and more specifically to digital circuits made from GaAs and related compounds.
- Electrical and Electronic Equipment