Accession Number:

ADD019400

Title:

System for Determining Size and Location of Defects in Material by Use of Microwave Radiation

Descriptive Note:

Patent, Filed 12 Feb 97, patented 12 Jan 99

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s):

Report Date:

1999-01-12

Pagination or Media Count:

8.0

Abstract:

Microwave radiation emitted from a single antenna is focused on a targeted material from which reflected radiation is received by the same antenna to provide signal measurement data from which detected material defects are calculated by determination of void location and size. Antenna position and orientation is adjusted to obtain the signal measurement data from of the microwave radiation reflection along at least two target incidence paths from the same target location, one of which is normal to said targeted surface of the material and the other oblique thereto at a scattering angle at which the signal radiation intensity is minimized.

Subject Categories:

  • Miscellaneous Detection and Detectors
  • Radiofrequency Wave Propagation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE